Application of optimization methods for improved electrical metrology

Authors

  • Marija Cundeva-Blajer Ss. Cyril and Methodius University, Faculty of Electrical Engineering and Information Technologies-Skopje

DOI:

https://doi.org/10.21014/acta_imeko.v5i3.378

Abstract

In electrical quantities metrology numerous examples of stochastic processes exist and a need for optimal solutions is posed. Here stochastic genetic algorithm optimization is used for solving two typical metrological problems: 1) minimization of the metrological parameters (final accuracy) in the design process of instruments and 2) predicting metrological reference standard’s time-drift, i.e. re-calibration interval. The first case is the optimal metrological design of a combined instrument transformer and the second case is the analysis of resistance standard time-drift.

Author Biography

Marija Cundeva-Blajer, Ss. Cyril and Methodius University, Faculty of Electrical Engineering and Information Technologies-Skopje

Associate Professor, DSc, Head of Laboratory for Electrical Measurements

Downloads

Additional Files

Published

2016-11-04

Issue

Vol. 5 No. 3 (2016)

Section

Research Papers

License

Authors who publish with this journal agree to the following terms:

  • Authors retain copyright and grant the journal right of first publication with the work simultaneously licensed under a Creative Commons Attribution License that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.
  • Authors are able to enter into separate, additional contractual arrangements for the non-exclusive distribution of the journal's published version of the work (e.g., post it to an institutional repository or publish it in a book), with an acknowledgement of its initial publication in this journal.
  • Authors are permitted and encouraged to post their work online (e.g., in institutional repositories or on their website) prior to and during the submission process, as it can lead to productive exchanges, as well as earlier and greater citation of published work (See The Effect of Open Access).