Improved evaluation of uncertainty for indirect measurement
The paper gives formulae for uncertainty evaluation of an indirect measurement based on direct measurements made by different types of measuring devices. The first type of the measuring devices has the specifications of a total error (e.g. digital instruments), while the second type has the specifications of offset, gain and linearity errors (e.g. analog to digital converters). The choice of a device range and the configuration of measuring circuits for decreasing uncertainty are considered. The conversion of the specifications for the first type to the specifications for the second type is discussed.
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