Method of integral nonlinearity testing and correction of multi-range ADC by direct measurement of output voltages of multi-resistors divider
AbstractA method of testing points generation for the identification and correction of the integral nonlinearity of high performance ADCâ€™s is presented. The proposed method is based on averaging all voltages of the multi-resistor voltage divider. The influence of the resistors errors and random errors of the ADC on the residual error of the integral nonlinearity correction for method based on multi-resistor divider is investigated.
Authors who publish with this journal agree to the following terms:
- Authors retain copyright and grant the journal right of first publication with the work simultaneously licensed under a Creative Commons Attribution License that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.
- Authors are able to enter into separate, additional contractual arrangements for the non-exclusive distribution of the journal's published version of the work (e.g., post it to an institutional repository or publish it in a book), with an acknowledgement of its initial publication in this journal.
- Authors are permitted and encouraged to post their work online (e.g., in institutional repositories or on their website) prior to and during the submission process, as it can lead to productive exchanges, as well as earlier and greater citation of published work (See The Effect of Open Access).