Method of integral nonlinearity testing and correction of multi-range ADC by direct measurement of output voltages of multi-resistors divider

Authors

  • Hu Zhengbing Dr.
  • Roman Kochan Dr.
  • Orest Kochan Dr.
  • Su Jun Dr.
  • Halyna Klym Dr.

DOI:

https://doi.org/10.21014/acta_imeko.v4i2.230

Abstract

A method of testing points generation for the identification and correction of the integral nonlinearity of high performance ADC’s is presented. The proposed method is based on averaging all voltages of the multi-resistor voltage divider. The influence of the resistors errors and random errors of the ADC on the residual error of the integral nonlinearity correction for method based on multi-resistor divider is investigated.

Author Biographies

Hu Zhengbing, Dr.

Huazhong Normal University, China

Roman Kochan, Dr.

Specialized Computer Systems Department of Lviv National Polytechnic University, Ukraine

Orest Kochan, Dr.

Information Measurement Technology Department of Lviv National Polytechnic University, Ukraine 

Su Jun, Dr.

Internet Of Things Dept. of Hubei University of Technology, China

Halyna Klym, Dr.

Specialized Computer Systems Department of Lviv National Polytechnic University, Ukraine

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Published

2015-06-29

Issue

Vol. 4 No. 2 (2015)

Section

Research Papers

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