The development of measuring setup for electrical noise research in two-dimensional semiconductor structures for quantum Hall resistance standard

Authors

  • Marcin Wojciechowski Central Office of Measures (GUM)
  • Kateryna Hovorova

DOI:

https://doi.org/10.21014/actaimeko.v13i4.1761

Keywords:

electrical noise measurement, 2D-COF/MOF, QHRS, ULNA

Abstract

This paper describes setups for measuring electrical noise in the frequency range from 10 kHz to 100 MHz of semiconductor structures made of new Dirac- materials - 2D-COF/MOF intended for the construction of quantum Hall resistance standard (QHRS). In measurement systems consisting of a spectrum analyzer working with a preamplifier, an input noise value of approximately 1 nV/√Hz at 100 kHz was achieved at a preamplifier gain of 400 V/V, and the noise figure (NF) of the entire measurement system was reduced to below 0.4 dB for higher frequencies, where this coefficient for the spectrum analyzer itself was of the order of 7 dB.

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Published

2024-11-26

Issue

Vol. 13 No. 4 (2024)

Section

Research Papers

License

Copyright (c) 2024 Marcin Wojciechowski, Kateryna Hovorova

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