Editorial to selected papers from 2019 IEEE international workshop on "Metrology for Industry 4.0 and IoT"

Authors

  • Leopoldo Angrisani Università di Napoli Federico II Dept. of Information Technology and Electrical Engineering via Claudia 21 80125 Napoli
  • Francesco Bonavolontà Università di Napoli Federico II Dept. of Information Technology and Electrical Engineering via Claudia 21 80125 Napoli

DOI:

https://doi.org/10.21014/acta_imeko.v9i4.921

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Published

2020-12-17

Issue

Section

Editorials