Application of machine learning techniques and empirical mode decomposition for the classification of analog modulated signals

Domenico Luca Carnì, Eulalia Balestrieri, Ioan Tudosa, Francesco Lamonaca

Abstract


In this article, an automatic Analog Modulation Classifier based on Empirical mode decomposition and Machine learning approaches (AMC-EM) is proposed. The AMC-EM operates without a priori information and can recognise typical analog modulation schemes: amplitude modulation, phase modulation, frequency modulation, and single sideband modulation. The AMC-EM uses Empirical Mode Decomposition (EMD) to evaluate the features of the signal for the successive classification by using Machine Learning (ML). In the design of the AMC-EM, the selection of the specific ML technique is performed by comparing, with numerical tests, the performance of the (i) Support Vector Machine (SVM), (ii) k-nearest neighbor classifier, and (iii) adaptive boosting, since they are commonly used in the field of signal classification. The tests have highlighted that the SVM, specifically the quadratic SVM, permits the best possible performance concerning classification accuracy, by considering different noise intensities superimposed on the signal. To assess the advantages of the proposal, a comparison with other classifiers available in the literature has been undertaken through numerical tests. Finally, the AMC-EM is experimentally evaluated, and the experimental results agree with those of the simulation.



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DOI: http://dx.doi.org/10.21014/acta_imeko.v9i2.800