Introductory notes for the Acta IMEKO thematic issue on the 2023 SBM Metrology Conference – part 3

Authors

  • Carlos Hall Barbosa Postgraduate Programme in Metrology, Pontifical Catholic University of Rio de Janeiro (PUC-Rio), Brazil
  • Daniel Ramos Louzada Postgraduate Programme in Metrology, Pontifical Catholic University of Rio de Janeiro (PUC-Rio), Brazil
  • Rodrigo Costa-Felix Laboratory of Ultrasound, Directory of Scientific Metrology and Technology, National Institute of Metrology, Quality, and Technology (Inmetro), Brazil

DOI:

https://doi.org/10.21014/actaimeko.v14i4.2275

Abstract

This thematic issue of Acta IMEKO brings together selected contributions from the 2023 SBM Metrology Conference, highlighting recent advances and emerging challenges across a broad spectrum of metrological applications. The papers collected herein reflect the central role of metrology in supporting technological innovation, regulatory frameworks, industrial competitiveness, and sustainability. Topics span digital transformation in measurement systems, quantum-based electrical standards, radiation and environmental metrology, uncertainty-informed conformity assessment, nondestructive material characterisation, and advanced photovoltaic technologies. Together, these contributions illustrate how rigorous measurement science underpins reliable decision-making in increasingly complex technical and socio-economic contexts. This issue underscores the dynamic evolution of metrology and its growing relevance in addressing contemporary scientific and industrial demands.

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Published

2025-12-31

Issue

Vol. 14 No. 4 (2025)

Section

Editorials

License

Copyright (c) 2025 Carlos Hall Barbosa, Daniel Ramos Louzada, Rodrigo Costa-Felix

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