Establishment of measurement traceability of dielectric-constant measurement using contact and non-contact methods

Authors

  • S. Satish LF, HF Impedance and DC Metrology, CSIR-National Physical Laboratory, New Delhi, India
  • Rajendra Meena LF, HF Impedance and DC Metrology, CSIR-National Physical Laboratory, New Delhi, India
  • Reva Singh Delhi Technological University, Delhi, India
  • Priyanka Jain LF, HF Impedance and DC Metrology, CSIR-National Physical Laboratory, New Delhi, India
  • Joges C. Biswas LF, HF Impedance and DC Metrology, CSIR-National Physical Laboratory, New Delhi, India

DOI:

https://doi.org/10.21014/actaimeko.v14i2.1739

Keywords:

dielectric constant, metrological traceability, parallel-plate-capacitor method, uncertainty in measurement

Abstract

To meet industry demands, measurement traceability for the dielectric constant of solid reference materials has been established at audio and radio frequencies. The dielectric constant is determined using capacitance-based contact and non-contact methods, where the dielectric material is sandwiched between the electrodes of a dielectric test fixture. A precision LCR meter measures the capacitance of solid dielectric materials, and results from contact and non-contact methods align well up to 1 MHz. Measurement uncertainty is evaluated according to the Guide to the Expression of Uncertainty in Measurement, with a detailed discussion of contributing factors.

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Published

2025-06-11

Issue

Vol. 14 No. 2 (2025)

Section

Research Papers

License

Copyright (c) 2025 Rajendra Meena

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