The role of metrology in the cyber-security of embedded devices

Abstract

The cyber-security of an embedded device is a crucial issue especially in the Internet of Things (IoT) paradigm, since the physical accessibility to the smart transducers eases an attacker to eavesdrop the exchanged messages. In this manuscript, the role of metrology in improving the characterization and security testing of embedded devices is discussed in terms of vulnerability testing and robustness evaluation. The presented methods ensure an accurate assessment of the device’s security by relying on statistical analysis and design of experiments. A particular focus is given on power analysis by means of a scatter attack. In this context, the metrological approach contributes to guaranteeing the confidentiality and integrity of the data exchanged by IoT transducers.