Memristive devices for metrological applications

Authors

  • Vitor Cabral Instituto Português da Qualidade
  • Alessandro Cultrera Istituto Nazionale di Ricerca Metrologica- Quantum Metrology and Nanotechnologies
  • Shaochuan Chen RWTH-Aachen university
  • João Pereira INESC Microsistemas e Nanotecnologias
  • Luís Ribeiro Instituto Português da Qualidade
  • Isabel Godinho Instituto Português da Qualidade
  • Luca Boarino Istituto Nazionale di Ricerca Metrologica- Advanced Materials and Life Sciences Division
  • Nastacia De Leo Istituto Nazionale di Ricerca Metrologica- Advanced Materials and Life Sciences Division
  • Luca Callegaro Istituto Nazionale di Ricerca Metrologica- Quantum Metrology and Nanotechnologies
  • Susana Cardoso INESC Microsistemas e Nanotecnologias
  • Ilia Valov RWTH-Aachen university
  • Gianluca Milano Istituto Nazionale di Ricerca Metrologica- Advanced Materials and Life Sciences Division

DOI:

https://doi.org/10.21014/actaimeko.v12i3.1450

Keywords:

memristive, quantum conductance, quantum resistance, nanometrology

Abstract

The EMPIR project 20FUN06 MEMQuD - “Memristive devices as quantum standard for nanometrology” has as one of its fundamental goals the development of technical capability and scientific knowledge for the implementation of a quantum resistance standard based on memristive devices characterized by high scalability down to the nanometer scale, CMOS compatibility and working in air at room temperature. In this work it is presented an overview of the project, highlighted relevant characteristics and working principles of memristive devices and potential applications with focus on metrological application with framing allowed by the last revision of the International System of Units (SI) that is the motivation and background for the aim of this project

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Published

2023-09-26

Issue

Section

Research Papers