Toward a metrology-information layer for digital systems
Keywords:M-Layer, quantities, measurement units, measurement information infrastructure (MII), digital metrology
Recent work has proposed a metrology-information layer (M-Layer) to support digital systems with quantities and units by addressing the difficulties conventional quantity-unit systems pose for digitalization. This paper reports work toward developing the M-Layer’s current abstract conceptualization into a concrete model, working prototype, and demonstration software, with the eventual goal to create a FAIR (findable, accessible, interoperable, reusable) resource.
Copyright (c) 2023 Mark Kuster
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