Toward a metrology-information layer for digital systems

Authors

  • Mark Kuster Independent Researcher

DOI:

https://doi.org/10.21014/actaimeko.v12i1.1416

Keywords:

M-Layer, quantities, measurement units, measurement information infrastructure (MII), digital metrology

Abstract

Recent work has proposed a metrology-information layer (M-Layer) to support digital systems with quantities and units by addressing the difficulties conventional quantity-unit systems pose for digitalization. This paper reports work toward developing the M-Layer’s current abstract conceptualization into a concrete model, working prototype, and demonstration software, with the eventual goal to create a FAIR (findable, accessible, interoperable, reusable) resource.

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Published

2023-03-30

Issue

Vol. 12 No. 1 (2023)

Section

Research Papers

License

Copyright (c) 2023 Mark Kuster

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