Measurement of Electrical Quantities: Selected Extended Papers from the 27th IMEKO TC4 Conference 2026
Guest Editors: Prof. Luca Callegaro, Dr. Dragana Popović Renella, Prof. Carlos Roberto Hall Barbosa, D.Sc.
Submission dates: from the 11th of February 2027 to the 28th of February 2027
Publication scheduling: September 2027
This Special Issue collects extended and substantially enhanced versions of selected papers presented at the 27th IMEKO TC4 Conference 2026 with Special TC11 Technical Session, held in Prague on 16–18 September 2026. The IMEKO TC4 conference series is one of the most established international forums for the measurement of electrical quantities, and its 2026 edition, entitled “Measuring the Future”, focused on how measurement principles, instruments and metrological infrastructures must evolve to support future technologies while preserving accuracy, traceability, reliability and a sound evaluation of measurement uncertainty. The conference received 46 contributions from 13 countries; 44 were accepted after peer review and 28 full papers were published in the conference proceedings. From these, the conference organisers and the Section Editors have selected 13 papers that combine scientific quality with a clear potential for substantial extension, based on the conference review scores, the session chairs’ recommendations and the authors’ declared interest. The selected contributions cover the dissemination of electrical units and calibration of high-current instruments, data conversion and signal generation, magnetic and inductive sensors, cryogenic and microwave characterisation, energy storage devices, biomedical measurement systems, metrological traceability in IoT sensor networks and GUM-compliant uncertainty evaluation for machine-learning-based measurement models. Each extended manuscript must provide substantial new scientific content – such as additional experimental results, extended uncertainty analysis, methodological improvements or further validation – carry a title different from the conference paper, cite the original contribution and clearly identify the extensions in the cover letter, abstract, introduction and conclusions. The Special Issue will offer Acta IMEKO readers a coherent overview of current research in electrical metrology and instrumentation and will strengthen the link between the IMEKO TC4/TC11 community and the journal.
Keywords: electrical metrology; calibration and traceability; AC/DC transfer and high-current measurements; data converters and signal generation; magnetic, inductive and capacitive sensors; cryogenic and microwave measurements; energy storage characterisation; biomedical instrumentation; IoT and digital metrology; measurement uncertainty and machine learning
Important rules for all submitted papers:
- A new title should be chosen (with respect to the conference proceedings)
- The paper submitted to the Special Issue should be technically extended with respect to the paper included in the Conference Proceedings (i.e. additional data, or additional data processing)
- All submitted papers will undergo an anti-plagiarism check; thus, they are expected to have a similarity rate below 30% (also if compared to the Conference Proceedings)
- All submitted papers will undergo the peer-review process of the Journal (at least two anonymous independent reviewers)
- The paper should be correctly framed in the current literature about Instrumentation and Measurements, considering the latest studies published in related scientific journals (e.g. 'Measurement', IEEE Transactions on Instrumentation and Measurement', 'Metrologia', 'Acta IMEKO', etc)
- When submitting your paper, please write in the submission notes that 'The paper is submitted to the Special Issue on IMEKO TC4 Conference 2026' and specify the title of the original contribution
- The use of Acta IMEKO template is mandatory; please refer to the submission rules of the Journal: https://acta.imeko.org/index.php/acta-imeko/about/submissions
For further questions, please contact the Guest Editors for the Special Issue.
